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System Test

Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .

See Also: Systems, Equipment, Test Systems, System Integrators


Showing results: 1591 - 1605 of 4427 items found.

  • High Volume Semiconductor Substrate Interconnect Tester

    GATS-2100 - W.M. Hague Company

    Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors.The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements

  • Computer Servo Control Testing Machine for Rock Stiffness

    YAW-G300 - Jinan Testing Equipment IE Corporation

    The Computer Servo Control Testing Machine for Rock Stiffness is used for static fatigue compression test for conncrete & rock material under different parameter. The test includes compression, shearing test, three-point bending testing & fatigue test. Meanwhile, the Computer Servo Control Testing Machine can also realize the automatic control, measuring, data processing; curve analyzing, result displaying and test report printing in the process of various tests. The stiffness testing system can do full process test under stress and strain.

  • Environmental Control System (ECS) Tester

    H301 - Howell Instruments, Inc.

    The H301 Environmental Control System (ECS) Tester measures and displays parameters required to test and troubleshoot aircraft heating and air conditioning systems. These parameters include temperatures, pressures, AC and DC voltages, DC currents, and resistances.

  • Premier Diagnostic Test Meter

    PDSMP50-2-01-15-CAN - Parker Hannifin Corp.

    Parker's SensoControl Service Master Plus diagnostic test kits are the premier choice for measuring, recording and analyzing critical system data for any hydraulic or pneumatic system. Up to 1 billion data points memory storage.

  • Compact Antenna Test Range

    700.00 MHZ – 110000.00 MHZ - MVG

    A Compact Antenna Test Range (CATR) allows electrically large antennas to be measured at a significantly shorter distance than would be necessary in a traditional far-field test range. Compact ranges use a source antenna (feed) to radiate a spherical wave in the direction of a parabolic reflector, collimating it into a planar wave for aperture illumination of a Device under Test (DUT). It's lowest operational frequency is determined by the size of the reflector, its edge treatment and the absorbers. The two edge treatments available are serrated edge for general purpose applications, and rolled edge to achieve higher accuracy for special applications. Multiple-feed systems may be used to improve the far-field characteristics. A compact range test system also allows system level testing of a complete device architecture.

  • Multiport Coaxial Switch, DC to 4 GHz, SP4T

    87204A - Keysight Technologies

    The Keysight 87204A terminated multiport switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control created the Keysight 87204A which meet the requirements for highly repeatable switching elements in test instruments and switching interfaces. The Keysight 87204A is designed to operate for more than 10 million cycles. The exceptional 0.03 dB insertion loss repeatability is warranted for 5 million cycles at 25° C. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of this switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.

  • Multiport Coaxial Switch, DC to 20 GHz, SP4T

    87204B - Keysight Technologies

    The Keysight 87204B terminated multiport switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control created the Keysight 87204B which meet the requirements for highly repeatable switching elements in test instruments and switching interfaces. The Keysight 87204B is designed to operate for more than 10 million cycles. The exceptional 0.03 dB insertion loss repeatability is warranted for 5 million cycles at 25° C. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of this switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.

  • Motorized Force & Torque Measurement Test Stands

    Mark-10 Corp.

    Mark-10 offers a wide and unique range of motorized force measurement and torque measurement test stands. Motorized stands offer a significant advantage over manual test stands by providing constant test speed. Some models can be programmed for advanced test sequences to accommodate demanding applications. All motorized test stands carry the CE mark. A test stand is an integral part of a testing system, typically also comprising a force gauge or torque gauge, grips, software, and accessories.

  • Repeated Charge Discharge Test Set

    Sivananda Electronics

    The IS 13341 : 1992 has laid down the requirements for Ageing Test, Self-Healing Test and Destruction Test on Shunt Capacitors of the self healing type for AC Power Systems. The Ageing Test is to be performed at a specified voltage of 1.25 times the rated voltage for 750 hours. The test is to be followed with a repeated discharge cycle test which involves charging of the capacitor to a DC voltage and discharge of the same through an Inductance. Sivananda Electronics has developed this equipment for the benefit of capacitor manufacturers, for the first time in India.

  • Keithley Automated Characterization Suite Software

    ACS - Tektronix, Inc.

    Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.

  • Electronics Functional Test

    Bloomy Controls, Inc.

    Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).

  • Metallic Pendulum Impact Testing Machine

    JB-S Series - Jinan Testing Equipment IE Corporation

    JB-S series superior metallic pendulum impact testing system is strictly designed according to international standards ISO148, ASTM E23 and EN10045. The pendulum impact testing system is mainly used to determine the anti-impact capability of metal materials under dynamic load and is capable of doing a large number of of impact tests continuously. Adopting the important intelligent programmable logic controller (PLC) system, the pendulum impact testing system can realize the test process control and test data collection based on computer software program or digital display touch screen controller. The test data can be used for further data analysis, storage and printing. An aluminum shield with transparent tempered glass covers the load frame for safe operation. The impact testing machine of metallic pendulum is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.

  • Test Cell Controller

    RAPID - Genuen

    The Rapid II Test Cell Controller is an integrated, multi-loop control and data acquisition system for test cell applications, designed to provide maximum performance at an affordable price. Rapid II combines the latest in digital control technology with off-the-shelf hardware to produce one of the industry's most powerful, flexible and advanced controllers at a cost-effective price. This high-speed, 4-channel PID controller includes ample I/O to act both as a system controller and a data acquisition system, reducing overall system cost and complexity. Designed for integrators, OEMs, and DIYers, these systems can be configured to fit your needs with little upfront costs and minimal risk while benefiting from a stable, powerful platform.

  • RF Synthesizers Modules

    Holzworth Instrumentation, Inc.

    Holzworth's RF Synthesizers Modules were originally designed as the internal, tunable LO test sources for Holzworth phase noise analyzer products. Due to the need for easy integration, the HSM Series designs incorporate a long list of electrical and mechanical features to satisfy the demanding requirements of today's high performance communications systems and integrated test systems. FIELD PROVEN RELIABLITY with MTBFs exceeding 240kHrs.

  • 1500V Multifunction I-V Curve Tracer

    SOLAR I-Ve - HT Italia Srl

    SOLAR I-Ve allows both testing a single-phase (three-phase with optional MPP300) photovoltaic system and verifying I-V curve. Thanks to remote unit SOLAR02, it is possible to test the system complying with the requirement of simultaneity as provided for by the reference standard. SOLAR02 is a datalogger which, synchronized with SOLAR I-Ve, acquires the data relevant to irradiation and temperature while tests carried out by SOLAR I-Ve are carried out.

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